Note: mechanically and chemically stable colloidal probes from silica particles for atomic force microscopy.
Note: mechanically and chemically stable colloidal probes from silica particles for atomic force microscopy.
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注意：用于原子力显微镜的二氧化硅颗粒的机械和化学稳定的胶体探针。
DOI：
10.1063/1.4765299
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
G. Papastavrou
中科院分区：
文献类型：
--
作者：
V. Kuznetsov;G. Papastavrou
在这篇文章中，我们提出了一种新的方法来制备胶体探针的原子力显微镜烧结。这个过程的一个核心要素是在悬臂梁和充当探针的微米级二氧化硅颗粒之间引入无机“固定颈”。这种方法克服了以前对探针颗粒的限制，探针颗粒必须是低熔点材料，如硼硅酸盐玻璃或乳胶颗粒。这里提出的胶体探针从二氧化硅可以承受大的机械力。此外，由于没有粘合剂和胶体二氧化硅的表面化学研究充分，它们具有高的耐化学性。
In this note we present a novel approach to prepare colloidal probes for atomic force microscopy by sintering. A central element of this procedure is the introduction of an inorganic "fixation neck" between the cantilever and a micrometer-sized silica particle that is acting as probe. This procedure overcomes previous restrictions for the probe particles, which had to be low melting point materials, such as borosilicate glass or latex particles. The here-presented colloidal probes from silica can withstand large mechanical forces. Additionally, they have high chemical resistivity due to the absence of adhesives and the well-studied surface chemistry of colloidal silica.