Cathodoluminescence microscopy of hydrothermal and flux grown ZnO single crystals
Cathodoluminescence microscopy of hydrothermal and flux grown ZnO single crystals
复制标题
水热法和助熔剂生长的 ZnO 单晶的阴极发光显微镜
DOI：
10.1088/0022-3727/34/19/303
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
T. Sekiguchi
中科院分区：
文献类型：
--
作者：
A. Urbieta;P. Fernández;J. Piqueras;Ch. M. Hardalov;T. Sekiguchi
用热液法和通量法生长的ZnO单晶通过稳态和时间分辨阴极发光在不同晶面上进行了表征。随着延迟时间的增加，在记录的光谱中观察到峰在带边缘附近向低能量方向移动。在碱熔剂生长晶体的蚀刻坑区经常观察到这种行为，这表明存在与位错或位错周围的点缺陷有关的能带。在低能区，阴极发光光谱表明，深能级带不同组分的相对强度也取决于所研究表面的原子结构。时间分辨光谱清楚地揭示了这种复杂的行为。观察到的差异归因于每个面存在的缺陷的性质，特别是不同的杂质掺入过程，这些过程主要由原子构型和面的极性控制。
Bulk ZnO single crystals grown by the hydrothermal and flux methods have been characterized by steady-state and time resolved cathodoluminescence measurements performed on the different crystalline faces. A shift of the peak near band edge towards lower energies is observed in spectra recorded with increasing delay times. This behaviour is often observed in the etch pit regions in alkali flux grown crystals, which suggests the presence of a band related to dislocations or to the point defects surrounding the dislocations. In the low-energy region, cathodoluminescence spectra show that the relative intensity of the different components of the deep level band also depends on the atomic structure of the face under study. This complex behaviour is clearly revealed from the time resolved spectra. The differences observed are attributed to the nature of the defects present in each face and, in particular, to different impurity incorporation processes that could be mainly controlled by the atomic configuration and polarity of the planes.