Newly developed projection microscope for evaluation of electron emission characteristics of carbon nanotube FEAs
Newly developed projection microscope for evaluation of electron emission characteristics of carbon nanotube FEAs
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新开发的投影显微镜用于评估碳纳米管有限元分析的电子发射特性
DOI:
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发表时间:
2005
期刊:
影响因子:
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通讯作者:
others
中科院分区:
文献类型:
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作者:
G.Tatsumi;K.Hata;others