Electric field-induced carbon nanotube junction formation
Electric field-induced carbon nanotube junction formation
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DOI：
10.1063/1.1383279
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发表时间：
2001-07
影响因子：
4
通讯作者：
G. Ho;A. Wee;Jiadan Lin
中科院分区：
文献类型：
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作者：
G. Ho;A. Wee;Jiadan Lin
我们提出了明确的纳米结结构的实验证据后，应用高电场对多壁碳纳米管阵列。电场和热效应导致碳-碳键断裂和再沉积，从而形成纳米结。纳米结的生长机制被认为是开放式拓扑缺陷生长，其中两个相邻纳米管尖端处的碳原子发生化学反应并熔合形成纳米结阵列。
We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon–carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions.