On the behavior of ion implanted silicon strip detectors in high intensity low energy heavy ion beam experiments
On the behavior of ion implanted silicon strip detectors in high intensity low energy heavy ion beam experiments
复制标题
离子注入硅条探测器在高强度低能重离子束实验中的表现
DOI:
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发表时间:
2002
期刊:
影响因子:
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通讯作者:
D. Visser
中科院分区:
文献类型:
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作者:
W. Bradfield;R. Lewis;P. Parker;D. Visser