Measurements of Penning-Malmberg trap patch potentials and associated performance degradation

Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
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DOI:
10.1103/physrevresearch.6.l012008
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发表时间:
2024-01
影响因子:
4.2
通讯作者:
C. J. Baker;W. Bertsche;A. Capra;C. L. Cesar;M. Charlton;A. Christensen;R. Collister;A. Cridland Mathad;S. Eriksson;A. Evans;N. Evetts;J. Fajans;T. Friesen;M. Fujiwara;D. Gill;P. Grandemange;P. Granum;J. Hangst;M. Hayden;D. Hodgkinson;E. Hunter;C. A. Isaac;M. A. Johnson;J. Jones;S. A. Jones;S. Jonsell;A. Khramov;L. Kurchaninov;H. Landsberger;N. Madsen;D. Maxwell;J. McKenna;S. Menary;T. Momose;P. Mullan;J. Munich;K. Olchanski;A. Olin;J. Peszka;A. Powell;P. Pusa;C. Rasmussen;F. Robicheaux;R. Sacramento;M. Sameed;E. Sarid;D. M. Silveira;C. So;G. Stutter;T. Tharp;R. Thompson;C. Torkzaban;D. P. van der Werf;E. Ward;J. Wurtele
C. J. Baker;W. Bertsche;A. Capra;C. L. Cesar;M. Charlton;A. Christensen;R. Collister;A. Cridland Mathad;S. Eriksson;A. Evans;N. Evetts;J. Fajans;T. Friesen;M. Fujiwara;D. Gill;P. Grandemange;P. Granum;J. Hangst;M. Hayden;D. Hodgkinson;E. Hunter;C. A. Isaac;M. A. Johnson;J. Jones;S. A. Jones;S. Jonsell;A. Khramov;L. Kurchaninov;H. Landsberger;N. Madsen;D. Maxwell;J. McKenna;S. Menary;T. Momose;P. Mullan;J. Munich;K. Olchanski;A. Olin;J. Peszka;A. Powell;P. Pusa;C. Rasmussen;F. Robicheaux;R. Sacramento;M. Sameed;E. Sarid;D. M. Silveira;C. So;G. Stutter;T. Tharp;R. Thompson;C. Torkzaban;D. P. van der Werf;E. Ward;J. Wurtele
中科院分区:
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文献类型:
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作者:
C. J. Baker;W. Bertsche;A. Capra;C. L. Cesar;M. Charlton;A. Christensen;R. Collister;A. Cridland Mathad;S. Eriksson;A. Evans;N. Evetts;J. Fajans;T. Friesen;M. Fujiwara;D. Gill;P. Grandemange;P. Granum;J. Hangst;M. Hayden;D. Hodgkinson;E. Hunter;C. A. Isaac;M. A. Johnson;J. Jones;S. A. Jones;S. Jonsell;A. Khramov;L. Kurchaninov;H. Landsberger;N. Madsen;D. Maxwell;J. McKenna;S. Menary;T. Momose;P. Mullan;J. Munich;K. Olchanski;A. Olin;J. Peszka;A. Powell;P. Pusa;C. Rasmussen;F. Robicheaux;R. Sacramento;M. Sameed;E. Sarid;D. M. Silveira;C. So;G. Stutter;T. Tharp;R. Thompson;C. Torkzaban;D. P. van der Werf;E. Ward;J. Wurtele

文献摘要

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激光电离反氢所产生的反质子被观察到能迅速逃离ALPHA陷阱。此外,正电子等离子体在陷阱被激光照射几个小时后加热得更快。这些现象可能是由贴片电位引起的--电位沿沿着金属表面的变化。一个简单的模型解释的补丁电位的影响的粒子损失,和一个实验技术,使用捕获的电子被开发用于测量所产生的补丁电位的电场。通过控制实验和仿真验证了模型的有效性
Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations