AFM Study of Tethered Polystyrene-b-poly(methyl methacrylate) and Polystyrene-b-poly(methyl acrylate) Brushes on Flat Silicate Substrates
AFM Study of Tethered Polystyrene-b-poly(methyl methacrylate) and Polystyrene-b-poly(methyl acrylate) Brushes on Flat Silicate Substrates
复制标题
DOI：
10.1021/ma000434e
复制
发表时间：
2000-10
期刊：
影响因子：
5.5
通讯作者：
Bin Zhao;W. Brittain;Wensheng Zhou;Stephen Z. D. Cheng
中科院分区：
文献类型：
--
作者：
Bin Zhao;W. Brittain;Wensheng Zhou;Stephen Z. D. Cheng
利用原子力显微镜（AFM）研究了平面基底上的聚苯乙烯-b-聚甲基丙烯酸甲酯（PS-b-PMMA）和聚苯乙烯-b-聚丙烯酸甲酯（PS-b-PMA）分子刷。用CH 2Cl 2处理后的PS-b-PMMA表面是光滑的;用环己烷处理导致相对粗糙的表面，在具有较薄PMMA层的刷子中更明显。PS-b-PMA刷在用CH 2Cl 2处理后表现出不同的纳米形态，这可能是由于PS和PMA之间更高的Flory-Huggins相互作用参数。用30 nm PS和10 nm PMMA与CH 2Cl 2和环己烷的混合溶剂处理PS-b-PMMA刷导致各种形貌，包括光滑表面、粗糙表面、具有不规则结构的非常粗糙的表面和具有不寻常纳米形态的非常粗糙的表面。形态尺度依赖于栓系二嵌段刷的厚度。
Atomic force microscopy (AFM) has been used to study tethered polystyrene-b-poly(methyl methacrylate) (PS-b-PMMA) and polystyrene-b-poly(methyl acrylate) (PS-b-PMA) brushes on flat substrates. The PS-b-PMMA surface was smooth after treatment with CH2Cl2; treatment with cyclohexane led to a relatively rough surface, more obvious in a brush with a thinner PMMA layer. PS-b-PMA brushes exhibited a different nanomorphology after treatment with CH2Cl2, which is may be due to the higher Flory−Huggins interaction parameter between PS and PMA. Treatment of a PS-b-PMMA brush with 30 nm PS and 10 nm PMMA with mixed solvents of CH2Cl2 and cyclohexane resulted in a variety of morphologies including a smooth surface, a rough surface, a very rough surface with irregular structures, and a very rough surface with an unusual nanomorphology. The morphological scale was dependent on the thickness of the tethered diblock brushes.