Potential of CCDs for UV and X-ray plasma diagnostics
Potential of CCDs for UV and X-ray plasma diagnostics
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CCD 在紫外和 X 射线等离子体诊断中的潜力
DOI：
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发表时间：
1985
期刊：
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通讯作者：
M. Blouke
中科院分区：
文献类型：
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作者：
J. Janesick;T. Elliott;H. Marsh;S. Collins;J. McCarthy;M. Blouke
一项为天基 X 射线天文学成像光谱仪开发电荷耦合器件 (CCD) 传感器的计划正在进行中。迄今为止，实验室线发射光谱已在 277 至 8000 eV 范围内获得（碳通过铜 K-α 发射），并且 CCD 灵敏度已在 1.1 至 8000 eV 范围内得到证明。图像分辨率非常出色，但几乎完全受到 15 微米像素尺寸的限制。介绍了这些结果并描述了允许如此低能量响应、高光谱分辨率和有效电荷收集的专门技术。最后，对目前限制 UV 和 X 射线性能的一种特定 CCD 特性进行了分析：电荷扩散。
A program is under way to develop charge-coupled device (CCD) sensors for space-based X-ray astronomy imaging spectrometers. To date, laboratory line-emission spectra have been acquired throughout the range of 277 to 8000 eV (carbon through copper K-alpha emission) and CCD sensitivity has been demonstrated throughout the range of 1.1 through 8000 eV. Image resolution is excellent, limited almost entirely by the 15 micron pixel size. These results are presented and specialized techniques are described which permit such low energy response, high spectral resolution, and efficient charge collection. Finally, analysis is presented of one particular CCD characteristic which currently limits UV and X-ray performance: charge diffusion.