Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy
Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy
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DOI：
10.1063/1.3593138
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发表时间：
2011-05-23
影响因子：
4
通讯作者：
Trolier-McKinstry, S.
中科院分区：
文献类型：
--
作者：
Griggio, F.;Jesse, S.;Trolier-McKinstry, S.
带激励压电响应力显微镜使铁电薄膜的非线性压电行为的局部调查。然而，与尖端-表面结的动态共振响应相关的附加非线性的存在会使材料非线性的研究复杂化。在这里，两个非线性源的相对重要性被检查作为激励函数的函数。结果发现，为了最大限度地减少非线性尖端-表面相互作用的影响，但实现良好的信号噪声水平，必须使用最佳的激发函数。(C)2011年美国物理学会。[doi：10.1063/1.3593138]
Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3593138]