Soft X-ray detection and photon counting spectroscopy with commercial 4H-SiC Schottky photodiodes
Soft X-ray detection and photon counting spectroscopy with commercial 4H-SiC Schottky photodiodes
复制标题
使用商用 4H-SiC 肖特基光电二极管进行软 X 射线检测和光子计数光谱
DOI：
10.1016/j.nima.2016.05.053
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发表时间：
2016
影响因子：
1.4
通讯作者：
A. M. Barnett
中科院分区：
文献类型：
--
作者：
S. Zhao;T. Gohil;G. Lioliou;A. M. Barnett
本文报道了两种不同有效面积（0.06mm ~ 2和0.5mm ~ 2）的商用4 H-SiC肖特基光电二极管的室温电学特性和X射线探测测量结果。即使在高电场强度（0.06 mm 2二极管为403 kV/cm; 0.5 mm 2二极管为227 kV/cm）下，器件也表现出低暗电流（小于10 pA）。X射线测量的结果表明，二极管可以用作光子计数光谱X射线探测器与适度的能量分辨率：在5.9 keV的1.8 keV和3.3 keV的半高宽，为0.06 mm 2和0.5 mm 2的设备，分别。噪声分析的光电二极管耦合到一个定制的低噪声电荷敏感三极管。
The results of electrical characterisation and X-ray detection measurements of two different active area (0.06 mm2and 0.5 mm2) commercial 4H-SiC Schottky photodiodes at room temperature are reported. The devices exhibited low dark currents (less than 10 pA) even at a high electric field strengths (403 kV/cm for 0.06 mm2diodes; 227 kV/cm for 0.5 mm2diodes). The results of the X-ray measurements indicate that the diodes can be used as photon counting spectroscopic X-ray detectors with modest energy resolutions: FWHM at 5.9 keV of 1.8 keV and 3.3 keV, for the 0.06 mm2and 0.5 mm2devices, respectively. Noise analysis of the photodiodes coupled to a custom low noise charge sensitive preamplifier is also presented.