Crosstalk Characterization in Geiger-Mode Avalanche Photodiode Arrays
Crosstalk Characterization in Geiger-Mode Avalanche Photodiode Arrays
复制标题
盖革模式雪崩光电二极管阵列中的串扰表征
DOI：
10.1109/led.2007.915373
复制
发表时间：
2008
影响因子：
4.9
通讯作者：
E. Rimini
中科院分区：
文献类型：
--
作者：
E. Sciacca;G. Condorelli;S. Aurite;S. Lombardo;M. Mazzillo;D. Sanfilippo;G. Fallica;E. Rimini
继我们的工作盖革模式雪崩光电二极管阵列，我们最近一直在处理的串扰问题，在新开发的密集阵列的像素中心之间的最小距离为84妈妈。在本文中，我们提出了我们的串扰测量方法，包括实验装置和离线计算方法。已经执行串扰概率PCT与电容的不同表征，以在没有测量设置加载像素时外推PCT。我们还提出了关于串扰概率与像素距离和偏置的结果。此外，通过采用稍微不同的方法，测量了概率密度衰减时间以调查串扰起源。
Following our work on Geiger-mode avalanche photodiode arrays, we have recently been dealing with the crosstalk issue in newly developed dense arrays with a minimum distance between pixel centers of 84 mum. In this paper, we present our crosstalk measurement approach, including the experimental setup and the offline calculation methods. Different characterizations of the crosstalk probability PCT versus capacitance have been performed to extrapolate the PCT when no measurement setup loads the pixels. We also present results regarding the crosstalk probability versus pixel distance and bias. Moreover, by adopting a slightly different approach, the probability density decay time has been measured to investigate about crosstalk origin.