Stretchable and durable conductive fabric for ultrahigh performance electromagnetic interference shielding
Stretchable and durable conductive fabric for ultrahigh performance electromagnetic interference shielding
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DOI：
10.1016/j.carbon.2018.12.034
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发表时间：
2019-04-01
期刊：
影响因子：
10.9
通讯作者：
Li, Zhong-Ming
中科院分区：
文献类型：
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作者：
Jia, Li-Chuan;Xu, Ling;Li, Zhong-Ming
高精度、高灵敏度电子仪器的快速发展，迫切需要在微小厚度下屏蔽效能（EMI SE）达到90db以上的超高性能电磁干扰屏蔽材料。本文通过在碳纤维织物（CFF）上集成银纳米线（AgNWs）和保形聚氨酯（PU）层，制备了一种用于超高性能EMI屏蔽的高导电织物（ECF）。所得到的ECF具有15390 S/m的高电导率和106.0 dB的异常EMI SE，厚度仅为0.36 mm。重要的是，即使在长期循环变形中，超高EMI SE在ECF中也是可靠的，在100次拉伸-释放循环（10%应变）后保持83%，在5000次弯曲-释放循环（2.0 mm弯曲半径）后保持97%。ECF在超声处理（60 min）、剥离试验（100次循环）和强酸/强碱溶液（PH = 2.0/12.0）下也表现出优异的耐受性，具有机械牢度和化学耐久性。我们的工作证明了一种具有机械和化学耐久性的超高电磁干扰屏蔽材料的轻松开发，即使在恶劣条件下也可能适用于高精度和敏感的电子仪器。(C) 2018 Elsevier Ltd.版权所有。
Ultrahigh performance electromagnetic interference (EMI) shielding materials with an EMI shielding effectiveness (EMI SE) of above 90 dB at a tiny thickness are urgently needed due to the rapid development of high precision and sensitive electronic instruments. Herein, a highly electrically conductive fabric (ECF) was fabricated for ultrahigh performance EMI shielding by integrating silver nanowires (AgNWs) and conformal polyurethane (PU) layers on a carbon fiber fabric (CFF). The resultant ECF exhibited a very high electrical conductivity of 15390 S/m and an exceptional EMI SE of 106.0 dB at a thickness of only 0.36 mm. Importantly, the ultrahigh EMI SE was reliable in our ECF even undergoing long-term cycling deformations, with 83% retention after 100 stretching-release cycles (10% strain) and 97% retention after 5000 bending-release cycles (2.0 mm bending radius). The ECF also exhibited excellent resistance to ultrasonic treatment (60 min), peeling test (100 cycles), and strong acidic/alkaline solutions (PH = 2.0/12.0), indicating mechanical fastness and chemical durability. Our work demonstrates the facile development of an ultrahigh EMI shielding material with both mechanical and chemical durability, potentially suitable for high precision and sensitive electronic instruments even under harsh conditions. (C) 2018 Elsevier Ltd. All rights reserved.