Measurement of dispersive forces between evaporated metal surfaces in the range below 100 nm
Measurement of dispersive forces between evaporated metal surfaces in the range below 100 nm
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测量 100 nm 以下范围内蒸发金属表面之间的色散力
DOI：
10.1063/1.2832664
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发表时间：
2007
影响因子：
4
通讯作者：
J. D. Hosson
中科院分区：
文献类型：
--
作者：
P. V. Zwol;G. Palasantzas;M. V. D. Schootbrugge;J. D. Hosson
在这项工作中，我们描述了分散力（货车范德华/卡西米尔）测量金表面之间的分离，作为接近12 nm。力的测量是在平面球配置原子力显微镜在12和200 nm之间的距离范围内进行。这是通过使用蒸镀光滑金属表面的球体和平面，和刚性杠杆，以尽量减少跳跃到接触的问题。最后，它表明，低于100 nm的分离，实验和理论被发现在10%以内的协议，包括在理论中的测量的光学性质的金和表面粗糙度的贡献。
In this work, we describe dispersion force (van der Waals/Casimir) measurements between gold surfaces at separations as close as 12nm. The force measurements were performed in the plane-sphere configuration by atomic force microscopy at distances ranging between 12 and 200nm. This was accomplished by using evaporated smooth metal surfaces for both sphere and plane, and stiff cantilevers to minimize jump-to-contact problems. Finally, it is shown that below separations of 100nm, experiment and theory are found in agreement within 10% by including in the theory the measured optical properties of gold and contribution from surface roughness.