Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging
Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging
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DOI：
10.1002/rcm.6719
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发表时间：
2013-12-30
影响因子：
2
通讯作者：
Heeren, Ron M. A.
中科院分区：
文献类型：
--
作者：
Kiss, Andras;Smith, Donald F.;Heeren, Ron M. A.
二次离子质谱的显微镜模式成像是一种同时具有高空间分辨率和复杂表面生物分子高速成像的技术。技术发展，如新的位置敏感检测器，与多原子原离子源相结合，需要利用显微镜模式质谱成像的全部潜力，即有效地推动超高空间分辨率，样品通量和灵敏度的极限。将C-60一次源与商业质量显微镜组合用于显微镜模式二次离子质谱成像。探测器设置是Medipix/Timepix系列的像素化探测器，具有高压后加速功能。该系统的质谱和成像性能进行了测试与各种基准样品和薄tissuesects. The高二次离子产率（相对于'传统'单原子一次离子源）的C-60一次离子源和高电压检测器设置的灵敏度提高显微镜模式二次离子质谱成像。与其他显微镜模式的成像systems相比，分析时间和信噪比得到改善，所有在高空间resolutions.CONCLUSIONSWe已经证明了一个C-60离子显微镜与Timepix检测器的高空间分辨率显微镜模式二次离子质谱成像的独特能力。版权所有（c）2013约翰威利父子有限公司
RATIONALEMicroscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces. Technological developments such as new position-sensitive detectors, in combination with polyatomic primary ion sources, are required to exploit the full potential of microscope mode mass spectrometry imaging, i.e. to efficiently push the limits of ultra-high spatial resolution, sample throughput and sensitivity.METHODSIn this work, a C-60 primary source was combined with a commercial mass microscope for microscope mode secondary ion mass spectrometry imaging. The detector setup is a pixelated detector from the Medipix/Timepix family with high-voltage post-acceleration capabilities. The system's mass spectral and imaging performance is tested with various benchmark samples and thin tissue sections.RESULTSThe high secondary ion yield (with respect to 'traditional' monatomic primary ion sources) of the C-60 primary ion source and the increased sensitivity of the high voltage detector setup improve microscope mode secondary ion mass spectrometry imaging. The analysis time and the signal-to-noise ratio are improved compared with other microscope mode imaging systems, all at high spatial resolution.CONCLUSIONSWe have demonstrated the unique capabilities of a C-60 ion microscope with a Timepix detector for high spatial resolution microscope mode secondary ion mass spectrometry imaging. Copyright (c) 2013 John Wiley & Sons, Ltd.