Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope
Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope
复制标题
通过扫描麦克斯韦应力显微镜研究聚偏二氟乙烯-三氟乙烯共聚超薄膜的电场诱导结构变化
DOI：
10.1116/1.589765
复制
发表时间：
1998
影响因子：
1.4
通讯作者：
A. Takahara
中科院分区：
文献类型：
--
作者：
T. Kajiyama;Noppadol Khuwattanasil;A. Takahara
采用旋涂法在镀金硅片上制备了10 nm厚的聚偏氟乙烯-三氟乙烯共聚物[P（VDF/TrFE），VDF 75 mol %]聚偏氟乙烯（PVF/TrFE）薄膜，并用傅里叶变换红外反射吸收光谱研究了薄膜的聚集态。发现P（VDF/TrFE）即使在受限状态（例如SiO2膜）下也形成铁电相。电场通过镀金悬臂梁尖端局部施加在薄膜上。通过扫描麦克斯韦应力显微镜（SMM）测量表面电位变化来评估P（VDF/TrFE）的偶极矩取向的变化。SMM图像显示，P（VDF/TrFE）的局部偶极矩取向的双折射薄膜可以通过施加电场通过原子力显微镜针尖改变。
Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mol %] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip.