Quantifying Angular Correlations between the Atomic Lattice and the Superlattice of Nanocrystals Assembled with Directional Linking.
Quantifying Angular Correlations between the Atomic Lattice and the Superlattice of Nanocrystals Assembled with Directional Linking.
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DOI：
10.1021/acs.nanolett.7b00584
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发表时间：
2017-02
期刊：
影响因子：
10.8
通讯作者：
I. Zaluzhnyy;R. Kurta;Alexander André;O. Gorobtsov;M. Rose;P. Skopintsev;I. Besedin;A. Zozulya;M. Sprung;F. Schreiber;I. Vartanyants;Marcus Scheele
中科院分区：
文献类型：
--
作者：
I. Zaluzhnyy;R. Kurta;Alexander André;O. Gorobtsov;M. Rose;P. Skopintsev;I. Besedin;A. Zozulya;M. Sprung;F. Schreiber;I. Vartanyants;Marcus Scheele
我们表明，X射线散射与纳米聚焦光束和X射线互相关分析的组合是一个有效的方法与一个单一的实验中的介晶纳米粒子组件的完整结构表征。我们分析了几百个衍射图案在个别样品的位置，也就是说，个别晶粒，获得一个有意义的统计分布的超晶格和原子晶格有序。同时小角度和广角X射线散射相同的样品位置，使我们能够确定超晶格的结构和取向以及原子晶格的前两个布拉格峰的角度相关性，它们相对于超晶格的取向，以及由于局部结构紊乱的平均取向失配。该实验对于通过纳米晶体的同时自组装和与导电配体的表面官能化制备的合成介晶特别有利。虽然迄今为止这种材料的结构表征一直具有挑战性，但本方法现在允许将介晶结构与光电性质相关联。
We show that the combination of X-ray scattering with a nanofocused beam and X-ray cross correlation analysis is an efficient way for the full structural characterization of mesocrystalline nanoparticle assemblies with a single experiment. We analyze several hundred diffraction patterns at individual sample locations, that is, individual grains, to obtain a meaningful statistical distribution of the superlattice and atomic lattice ordering. Simultaneous small- and wide-angle X-ray scattering of the same sample location allows us to determine the structure and orientation of the superlattice as well as the angular correlation of the first two Bragg peaks of the atomic lattices, their orientation with respect to the superlattice, and the average orientational misfit due to local structural disorder. This experiment is particularly advantageous for synthetic mesocrystals made by the simultaneous self-assembly of nanocrystals and surface-functionalization with conductive ligands. While the structural characterization of such materials has been challenging so far, the present method now allows correlating the mesocrystalline structure with optoelectronic properties.