CHARACTERIZATION OF DIFFUSION PROCESS IN OXIDE GLASSES BASED ON CORRELATION BETWEEN ELECTRIC CONDUCTION AND DIELECTRIC-RELAXATION
CHARACTERIZATION OF DIFFUSION PROCESS IN OXIDE GLASSES BASED ON CORRELATION BETWEEN ELECTRIC CONDUCTION AND DIELECTRIC-RELAXATION
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DOI:
10.1016/0022-3093(75)90019-8
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发表时间:
1975-01-01
影响因子:
3.5
通讯作者:
NAMIKAWA, H
中科院分区:
文献类型:
--
作者:
NAMIKAWA, H
Electric conduction was correlated with dielectric relaxation for many ionically and electronically conducting oxide glasses. On the basis of this correlation, the carrier-diffusion process occurring in the glasses was identified. Of the three types of diffusion processes (localized diffusion process, non-localized diffusion process I and non-localized diffusion process II) one or more were found in each glass. The diffusion process shifted from one type to another with varying glass composition in certain series of glasses. The conditions of preparation of the glasses were found to influence the diffusion processes in these glasses. These facts are discussed in terms of the ‘microstructure’ of glass.