Dual-gate low-voltage organic transistor for pressure sensing

Dual-gate low-voltage organic transistor for pressure sensing
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DOI:
10.7567/apex.10.021601
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发表时间:
2017-01
影响因子:
2.3
通讯作者:
Yushi Tsuji;H. Sakai;Linrun Feng;Xiaojun Guo;H. Murata
Yushi Tsuji;H. Sakai;Linrun Feng;Xiaojun Guo;H. Murata
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Yushi Tsuji;H. Sakai;Linrun Feng;Xiaojun Guo;H. Murata

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我们在双栅有机压力传感器中同时实现了低压工作(- 5 V)和大漏极电流(ID)调制,其中压电层堆叠在低压有机场效应晶体管(OFET)上。在试验中,施加300kpa压力载荷时,内径从3.9 × 10−9 A变为2.5 × 10−11 A,内径对压力载荷和释放有明显的响应。在100 kPa的压力载荷下,对该装置进行了耐久性循环测试,在整个测试过程中,ID调制都得到了一致的再现。
We simultaneously achieved low-voltage operation (−5 V) and large drain current (ID) modulation in a dual-gate organic pressure sensor in which a piezoelectric layer was stacked on a low-voltage organic field-effect transistor (OFET). During testing, ID changed from 3.9 × 10−9 to 2.5 × 10−11 A when a 300 kPa pressure load was applied, and ID clearly responded to the pressure load and release. An endurance cycle test of the device was performed using a pressure load of 100 kPa, and the ID modulation was consistently reproduced throughout the test.