Powder X-ray diffraction study of synthetic PdSn
Powder X-ray diffraction study of synthetic PdSn
复制标题
合成PdSn的粉末X射线衍射研究
作者：
F. Laufek;A. Vymazalová;J. Plášil
报道了改进的合成PdSnX-射线粉末衍射数据。粉末衍射数据是用实验室X射线源(CUKα)收集的，用于Rietveld精细化。PdSn(正交晶系，Pnma)的精制结晶学数据为a=6.1388(4)，b=3.89226(3)，c=6.3377(4)，V=6.1388(2)，Z=4，Dx=9.87g/cm~3。
Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (CuKα) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, Pnma) are a=6.1388(4), b=3.89226(3), c=6.3377(4) Å, V=151.43(2) Å3, Z=4, and Dx=9.87 g∕cm3.