The grain boundary structural transformation induced by the co-segregation of charged defects
The grain boundary structural transformation induced by the co-segregation of charged defects
复制标题
带电缺陷共偏析引起的晶界结构转变
DOI：
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发表时间：
2022
期刊：
影响因子：
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通讯作者：
Ikuhara Yuichi
中科院分区：
文献类型：
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作者：
Futazuka Toshihiro;Ishikawa Ryo;Shibata Naoya;Ikuhara Yuichi
