Through-thickness texture profiling by energy dispersive synchrotron diffraction

Through-thickness texture profiling by energy dispersive synchrotron diffraction
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通过能量色散同步加速器衍射进行全厚度纹理分析

DOI:
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发表时间:
2010
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通讯作者:
C. Genzel
C. Genzel
中科院分区:
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文献类型:
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作者:
R. Coelho;M. Klaus;C. Genzel

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两种新的方法,利用能量色散衍射的优点,适用于调查通过厚度变化的晶体织构:“实空间”和“拉普拉斯空间”的方法。第一种方法是通过在原光束和衍射光束中增加一对狭缝来定义一个小的计量体积。因此,深度分辨率是通过量规穿过样品的解耦z平移来实现的。第二种方法是基于Beer衰减定律,通过将不同阶次反射(例如0002,0004…)的极图分配给不同的平均信息深度来实现深度分辨率。由于镁合金对X射线的吸收率较低,因此选择变形轧制AZ31镁合金作为实验的“模型”材料。通过样品弯曲产生的厚度结晶织构的变化。结果给出了第一个洞察的可能性,快速纹理深度剖面调查应用无损检测方法,并代表了一个步骤,同时评估残余应力和纹理梯度。
Two new approaches that make use of the advantages of energy dispersive diffraction were applied to investigate through-thickness variations of the crystallographic texture: the `real-space' and the `Laplace-space' methods. The first consists of defining a small gauge volume by adding a pair of slits in the primary and the diffracted beams. Thus the depth resolution is achieved by a decoupled z translation of the gauge through the sample. The second method is based on the Beer attenuation law, and the depth resolution is achieved by assigning pole figures of different order reflections (e.g. 0002, 0004…) to different average information depths. Wrought rolled AZ31 magnesium alloy was selected as a `model' material for the experiments because of the low X-ray absorption of Mg. The through-thickness crystallographic texture variation was generated by sample bending. The results give a first insight into the possibilities of fast texture depth profile investigation applying nondestructive methods and represent a step forward towards a simultaneous evaluation of residual stress and texture gradients.