Multimodal microscopy using 'half and half' contact mode and ultrasonic force microscopy.
Multimodal microscopy using 'half and half' contact mode and ultrasonic force microscopy.
复制标题
使用“一半对一半”接触模式和超声波力显微镜的多模态显微镜。
DOI：
10.1088/0957-4484/25/33/335708
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发表时间：
2014
期刊：
影响因子：
3.5
通讯作者：
Skilbeck MS
中科院分区：
文献类型：
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作者：
Skilbeck MS
在多功能纳米结构材料的设计和制造方面的进步需要能够同时以纳米级分辨率绘制多种材料属性的表征技术。我们表明，这可以通过结合来自超声力显微镜(UFM)的纳米机械信息和通过接触模式扫描同时获得的摩擦力和电导率测量来实现。这利用了一种“对半”方法，其中AFM交替地在UFM和接触模式下操作，切换速率足够快，从而在图像的每个像素上同时获取接触模式和UFM信息。我们通过将这种多模式方法应用于由铜表面的石墨烯岛、硅氧化物衬底上的单壁碳纳米管(SWNTs)和石墨烯环氧复合材料组成的复合材料系统，展示了这种多模式方法的潜力。对半测量方法使摩擦力的测量没有地形串扰。对单壁碳纳米管样品的应用揭示了另一个优势；由于UFM的超级润滑性，它使标准接触模式成像技术能够应用于精细样品。
Advances in the design and fabrication of multifunctional nanostructured materials require characterization techniques capable of simultaneously mapping multiple material properties with nanoscale resolution. We show that this can be achieved by combining nanomechanical information from ultrasonic force microscopy (UFM) with simultaneously acquired friction force and conductivity measurements from contact mode scanning. This utilizes a'half and half'approach, where the AFM is operated alternatively in UFM and contact mode, with the switching rate sufficiently fast that simultaneous contact mode and UFM information is acquired at each pixel of an image. We demonstrate the potential of such a multimodal approach through its application to composite systems consisting of graphene islands on a copper surface, single-walled carbon nanotubes (SWNTs) on a silicon oxide substrate, and a graphene epoxy composite. The half and half approach enables the friction force to be measured without topographical cross-talk. Application to the SWNT sample reveals a further advantage; due to the superlubricity of UFM it enables standard contact mode imaging techniques to be applied to delicate samples.