A SPAD-Based QVGA Image Sensor for Single-Photon Counting and Quanta Imaging

A SPAD-Based QVGA Image Sensor for Single-Photon Counting and Quanta Imaging
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DOI:
10.1109/ted.2015.2464682
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发表时间:
2016-01-01
影响因子:
3.1
通讯作者:
Henderson, Robert K.
Henderson, Robert K.
中科院分区:
工程技术2区
文献类型:
--
作者:
Dutton, Neale A. W.;Gyongy, Istvan;Henderson, Robert K.

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提出了一种基于 CMOS 单光子雪崩二极管 (SPAD) 的四分之一视频图形阵列图像传感器,具有 8 μm 像素间距和 26.8% 填充因子 (FF)。模拟像素电子器件和可扩展的共享井 SPAD 器件的结合有助于实现高分辨率、高FF SPAD 成像阵列,从而展现光子散粒噪声限制的统计数据。 SPAD 在 1.5 V 超偏压 (EB) 下具有 47 次计数/秒的暗计数率,在 480 nm 下具有 39.5% 的光子检测概率 (PDP),在 1 V EB 下具有最小 1.1 ns 的死区时间。模拟单光子计数成像具有最大 14.2 mV/SPAD 事件灵敏度和 0.06e(-) 最小等效读取噪声。显示了二元量子图像传感器 (QIS) 16 kframes/s 实时过采样,以 4.6 倍过度曝光宽容度和 0.168e(-) 读取噪声验证了单光子 QIS 理论。
A CMOS single-photon avalanche diode (SPAD)-based quarter video graphics array image sensor with 8- mu m pixel pitch and 26.8% fill factor (FF) is presented. The combination of analog pixel electronics and scalable shared-well SPAD devices facilitates high-resolution, high-FF SPAD imaging arrays exhibiting photon shot-noise-limited statistics. The SPAD has 47 counts/s dark count rate at 1.5 V excess bias (EB), 39.5% photon detection probability (PDP) at 480 nm, and a minimum of 1.1 ns dead time at 1 V EB. Analog single-photon counting imaging is demonstrated with maximum 14.2-mV/SPAD event sensitivity and 0.06e(-) minimum equivalent read noise. Binary quanta image sensor (QIS) 16-kframes/s real-time oversampling is shown, verifying single-photon QIS theory with 4.6x overexposure latitude and 0.168e(-) read noise.