Cell-Aware Test
Cell-Aware Test
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细胞感知测试
DOI：
10.1109/tcad.2014.2323216
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发表时间：
2014
影响因子：
2.9
通讯作者：
A. Fast
中科院分区：
文献类型：
--
作者：
F. Hapke;W. Redemund;Andreas Glowatz;J. Rajski;Michael Reese;M. Hustava;Martin Keim;J. Schlöffel;A. Fast
本文介绍了新的细胞感测试（CAT）方法，该方法可以在基于CMOS的完整设计上具有基于晶体管级和缺陷的ATPG，以显着降低包括FinFET技术在内的制造IC的缺陷率。我们介绍了1,940个标准图书馆单元格的面向缺陷的CAT断层模型以及CAT在几种工业设计中的应用。我们提出了来自32 nm笔记本处理器和350 nm汽车设计的大量生产测试结果，包括每百万次有缺陷的缺陷率降低。我们还提出了CAT诊断和物理失败分析的结果，从一个失败的部位产生了结果，并为使用该功能快速提高先进技术节点的产量提供了前景。
This paper describes the new cell-aware test (CAT) approach, which enables a transistor-level and defect-based ATPG on full CMOS-based designs to significantly reduce the defect rate of manufactured ICs, including FinFET technologies. We present results from a defect-oriented CAT fault model generation for 1,940 standard library cells, as well as the application of CAT to several industrial designs. We present high volume production test results from a 32 nm notebook processor and from a 350 nm automotive design, including the achieved defect rate reduction in defective-parts-per-million. We also present CAT diagnosis and physical failure analysis results from one failing part and give an outlook for using the functionality for quickly ramping up the yield in advanced technology nodes.