A method of diagnostic test generation for transition faults
A method of diagnostic test generation for transition faults
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一种转换故障诊断测试生成方法
DOI：
10.1109/prdc.2015.47
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
Renji Ono and Satoshi Ohtake
中科院分区：
文献类型：
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作者：
Xiantao Jiang;Tian Song;Takashi Shimamoto and Lisheng Wang;渡邊恭之介，大竹哲史;Daichi Shimazu and Satoshi Ohtake;Syuichi Sato and Satoshi Ohtake;Renji Ono and Satoshi Ohtake
本文提出了一种完整的转换故障诊断测试生成方法。该方法建立了一个诊断测试生成模型，用于从给定的全扫描时序电路中区分出一对过渡故障，并使用普通的过渡故障ATPG工具。所提出的模型支持发射关闭捕获和发射关闭移位模式，这是支持的ATPG工具。由所提出的方法生成的诊断测试图案具有与给定电路的扫描测试图案相同的形式，即，不需要模式转换。实验结果表明，商业转换故障ATPG工具可以利用我们提出的方法使用基准电路，对于一个给定的不可区分的对，该方法可以产生一个测试模式，区分它们或证明它们是不可区分的。
This paper proposes a complete method of diagnostic test generation for transition faults. The method creates a diagnostic test generation model for a pair of transition faults to be distinguished from a given full-scan sequential circuit and employs an ordinary transition fault ATPG tool. The proposed model supports launch-off-capture and launch-off-shift modes which is supported by the ATPG tool. Diagnostic test patterns generated by the proposed method are of the same form as the scan test patterns of the given circuit, i.e., no pattern conversion is necessary. Experimental results show that a commercial transition fault ATPG tool can be utilized in our proposed method using benchmark circuits and, for a given undistinguished pair, the proposed method can generate a test pattern for distinguishing them or prove that they are indistinguishable.