A method of LFSR seed generation for scan -based BIST using constrained ATPG
A method of LFSR seed generation for scan -based BIST using constrained ATPG
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一种使用约束 ATPG 的基于扫描的 BIST 的 LFSR 种子生成方法
DOI：
10.1109/cisis.2013.136
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
Takanori Moriyasu and Satoshi Ohtake
中科院分区：
文献类型：
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作者：
Susumu Kariyuki;Atsuto Kubo;Hironori Washizaki and Yoshiaki Fukazawa;Takanori Moriyasu and Satoshi Ohtake
提出了一种VLSI基于扫描的BIST的LFSR种子生成方法。该方法以静态故障为目标，利用商用ATPG工具。实验结果表明，与传统的种子生成方法相比，该方法可以提高故障覆盖率，减少种子数量。
This paper proposes a method of LFSR seed generation for scan-based BIST of VLSI circuits. The proposed method targets static faults and utilizes a commercial ATPG tool. Experimental results show that the proposed method can improve fault coverage and reduce the number of seeds compared with the conventional seed generation.