A combined transient and steady state approach for robust lifetime spectroscopy with micrometer resolution
A combined transient and steady state approach for robust lifetime spectroscopy with micrometer resolution
复制标题
瞬态和稳态相结合的方法，可实现具有微米分辨率的稳健寿命光谱
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
M. Schubert
中科院分区：
文献类型：
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作者：
F. Heinz;L. E. Mundt;W. Warta;M. Schubert
我们提出了两种互补的微光致发光光谱技术的组合，分别在瞬态和稳态条件下工作。将时域引入到在稳态条件下运行的成熟的微观光致发光映射方法中，证明了在以微米空间分辨率测量的电荷载流子寿命的确定中的鲁棒性和可靠性的明显改善。寿命可达50 ns至ms以上。我们制定了一个校准程序，并将组合的全光致发光设置应用于高性能多晶硅。从建立的光致发光成像技术获得的寿命图像重建从微观图考虑横向扩散和光学模糊，揭示了更不利的影响，小角度晶界以及更高的寿命内的晶粒，可以推断出从标准的成像技术。（© 2015 WILEY‐VCH Verlag GmbH &Co. KGaA，魏因海姆）
We present the combination of two complementary micro‐photoluminescence spectroscopic techniques operating in transient and steady state condition, respectively. Introducing the time domain into the well‐established micro‐photoluminescence mapping approach operating under steady state conditions demonstrates a distinct improvement of the robustness and reliability in the determination of charge carrier lifetime measured with micrometer spatial resolution. Lifetimes from 50 ns to above ms are accessible. We elaborate a calibration procedure and apply the combined all‐photoluminescence setup to high‐performance multicrystalline silicon. A lifetime image obtained from the established photoluminescence imaging technique is reconstructed from the microscopic map by considering lateral diffusion and optical blurring, revealing a more detrimental influence of small angle grain boundaries as well as a higher lifetime within grains as may be deduced from the standard imaging technique. (© 2015 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)