Error rate of RSFQ circuits: theory
Error rate of RSFQ circuits: theory
复制标题
RSFQ 电路的错误率:理论
DOI:
10.1109/77.621786
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发表时间:
1997
影响因子:
1.8
通讯作者:
M. Feldman
中科院分区:
文献类型:
--
作者:
Q. Herr;M. Feldman
For the first time, the bit-error rate of an active SFQ experiment is compared to theoretical prediction. The theory of thermally induced errors is developed using the Fokker-Planck equation. The equivalent noise temperature of the experiment is found to be 11.0 K. The error rate vs. bias current follows an error function dependence and extrapolates to vanishingly small error rate at optimal bias.