Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope
Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope
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DOI：
10.1002/adma.201102579
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发表时间：
2012-01
影响因子：
29.4
通讯作者：
D. Golberg;P. Costa;Ming‐Sheng Wang;Xianlong Wei;Daiming Tang;Zhi Xu;Y. Huang;U. Gautam;Baodan Liu;H. Zeng;Naoyki Kawamoto;C. Zhi;M. Mitome;Y. Bando
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文献类型：
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作者：
D. Golberg;P. Costa;Ming‐Sheng Wang;Xianlong Wei;Daiming Tang;Zhi Xu;Y. Huang;U. Gautam;Baodan Liu;H. Zeng;Naoyki Kawamoto;C. Zhi;M. Mitome;Y. Bando
现代原位透射电子显微镜 (TEM) 方法不仅可以让人们以纳米级精度操控纳米级物体，还可以深入了解其物理和化学状态。专用 TEM 支架结合了传统高分辨率 TEM 仪器和原子力和/或扫描隧道显微镜探头的功能，成为纳米材料分析中的强大工具。这份进展报告基于作者过去五年的广泛努力，重点介绍了这些令人兴奋的方法的过去、现在和未来。兴趣的对象多种多样。它们包括碳、氮化硼和其他无机一维和二维纳米级材料，例如纳米管、纳米线和纳米片。所讨论的所有实验的关键点是，机械和电传输数据是在 TEM 中最终实现的高空间、时间和能量分辨率下在单个纳米结构水平上获取的，因此可以直接与给定纳米材料的形态、结构和化学特性联系起来。
Modern methods of in situ transmission electron microscopy (TEM) allow one to not only manipulate with a nanoscale object at the nanometer‐range precision but also to get deep insights into its physical and chemical statuses. Dedicated TEM holders combining the capabilities of a conventional high‐resolution TEM instrument and atomic force ‐, and/or scanning tunneling microscopy probes become the powerful tools in nanomaterials analysis. This progress report highlights the past, present and future of these exciting methods based on the extensive authors endeavors over the last five years. The objects of interest are diverse. They include carbon, boron nitride and other inorganic one‐ and two‐dimensional nanoscale materials, e.g., nanotubes, nanowires and nanosheets. The key point of all experiments discussed is that the mechanical and electrical transport data are acquired on an individual nanostructure level under ultimately high spatial, temporal and energy resolution achievable in TEM, and thus can directly be linked to morphological, structural and chemical peculiarities of a given nanomaterial.