Improvement of beam emittance of the CEA high intensity proton source SILHI
Improvement of beam emittance of the CEA high intensity proton source SILHI
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提高CEA高强度质子源SILHI的束流发射率
DOI：
10.1063/1.1149823
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发表时间：
1999
影响因子：
1.6
通讯作者：
S. Gammino
中科院分区：
文献类型：
--
作者：
R. Gobin;P. Beauvais;R. Ferdinand;P. Leroy;L. Celona;G. Ciavola;S. Gammino
由原子能委员会（CEA）-Saclay的SILHI源提取的强质子束的发射度是IPHI项目设计的关键参数。该参数甚至对于国家核物理研究所TRASCO项目的强质子源设计也具有相关作用。在CEA-INFN合作框架内进行的测试主要致力于在束线中注入不同气体的75 mA束发射度调查。结果表明，均方根归一化发射度下降了3倍，而复合引起的束流损失控制在5%以内。用Ar和Kr获得了约0.1 π min mrad的r-r′平面归一化发射度。
The emittance of the intense proton beam extracted by the source SILHI at Commisariat a l’Energie Atomique (CEA)-Saclay is a key parameter for the design of the IPHI Project RFQ. This parameter has a relevant role even for the design of an intense proton source for the TRASCO project of Istituto Nazionale di Fisica Nucleare (INFN). The tests performed in the framework of CEA-INFN collaboration have been mainly devoted to a 75 mA beam emittance investigation injecting different gases in the beam line. The results show that the rms normalized emittance decreases up to a factor 3 while the beam losses induced by recombination are contained within 5%. Normalized emittance in r-r′ plane of about 0.1 π min mrad have been obtained using Ar and Kr.