Improvement of accuracy and precision in refinement of crystal structure factors using zone-axis incidence and tilted CBED patterns
Improvement of accuracy and precision in refinement of crystal structure factors using zone-axis incidence and tilted CBED patterns
复制标题
使用区轴入射和倾斜 CBED 图案提高晶体结构因素细化的准确度和精确度
DOI:
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发表时间:
2021
期刊:
影响因子:
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通讯作者:
K. Tsuda and M. Terauchi
中科院分区:
文献类型:
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作者:
B. Aryal;D. Morikawa;K. Tsuda and M. Terauchi