Retention, re-emission and thermal desorption of He implanted into pyrolytic graphite
Retention, re-emission and thermal desorption of He implanted into pyrolytic graphite
复制标题
注入热解石墨的 He 的保留、再发射和热解吸
DOI:
10.1016/0022-3115(82)90287-2
复制
发表时间:
1982
影响因子:
3.1
通讯作者:
J. Ehrenberg
中科院分区:
文献类型:
--
作者:
W. Möller;B. Scherzer;J. Ehrenberg
8 keV3He ions have been implanted into edge-oriented pyrolytic graphite at temperatures of 120 K and 295 K. The retention behavior observed by nuclear reaction and residual gas analyses differs markedly from that observed in metals. Despite the negligible reflection coefficient, the mean re-emission coefficient at low fluence amounts to ~30% at room temperature, with a relative maximum at a fluence of 1.5 × 1017cm−2. Saturation is observed at fluences above 5 × 1017cm12. The implanted He is completely removed by annealing to 750 K. Reimplantation at room temperature shows an enhanced retention (~90%) at low fluences. The experimental results are discussed in terms of He diffusion, trapping at damage sites and possible structural changes of the material.