A stable cardinality distance for topological classification

A stable cardinality distance for topological classification
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拓扑分类的稳定基数距离

DOI:
10.1007/s11634-019-00378-3
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发表时间:
2019
影响因子:
1.6
通讯作者:
Spannaus, Adam
Spannaus, Adam
中科院分区:
计算机科学3区
文献类型:
--
作者:
Maroulas, Vasileios;Micucci, Cassie Putman;Spannaus, Adam

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这项工作结合了拓扑特征,通过持久性图分类点云数据产生的材料科学。持久性图是总结给定数据的连通性和漏洞的多集。持久性图空间上的新距离为材料科学数据的分类算法生成相关输入特征。该距离使用匹配点的成本和对应于图之间基数差异的正则化项来度量持久性图的相似性。建立这个距离的稳定性属性提供了理论上的理由使用的距离比较这样的图。分类方案成功地确定材料的晶体结构的噪声和稀疏的数据从合成原子探针层析成像实验。
This work incorporates topological features via persistence diagrams to classify point cloud data arising from materials science. Persistence diagrams are multisets summarizing the connectedness and holes of given data. A new distance on the space of persistence diagrams generates relevant input features for a classification algorithm for materials science data. This distance measures the similarity of persistence diagrams using the cost of matching points and a regularization term corresponding to cardinality differences between diagrams. Establishing stability properties of this distance provides theoretical justification for the use of the distance in comparisons of such diagrams. The classification scheme succeeds in determining the crystal structure of materials on noisy and sparse data retrieved from synthetic atom probe tomography experiments.
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