Bunch shape monitors using low energy secondary electron emission
Bunch shape monitors using low energy secondary electron emission
复制标题
使用低能二次电子发射的束形状监测器
DOI:
10.1063/1.44336
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发表时间:
2008
期刊:
影响因子:
--
通讯作者:
A. Feschenko
中科院分区:
文献类型:
--
作者:
A. Feschenko
To measure a longitudinal charge distribution in an ion linac beam it is preferable to apply bunch shape monitors using a low energy secondary emission electrons. Monitors of this type and their development are discussed. Different varieties of rf deflectors for a transverse modulation of secondary electrons are considered. Preliminary parameters of a bunch shape monitor for the SSC linac are presented. A detector to measure both longitudinal and transverse distributions of a two component ion beam is described.