Femtosecond electron diffraction for direct measurement of ultrafast atomic motions
Femtosecond electron diffraction for direct measurement of ultrafast atomic motions
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DOI：
10.1063/1.1593831
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发表时间：
2003-08-04
影响因子：
4
通讯作者：
Blaszczyk, L
中科院分区：
文献类型：
--
作者：
Cao, J;Hao, Z;Blaszczyk, L
我们已经开发了一个飞秒电子衍射系统，能够直接测量完整的瞬态结构与原子水平的细节和400-fs的时间尺度在固体材料。此外，衍射图像具有显着的信号-噪声比，以揭示长程有序，可以获得与一个单一的电子脉冲的持续时间为700 fs。用飞秒脉冲激光辐照银膜，直接观察到了超快晶格膨胀。(C)2003年，美国物理学会。
We have developed a femtosecond electron diffraction system capable of directly measuring the complete transient structures with atomic level detail and on 400-fs time scale in solid materials. Additionally, a diffraction image with significant signal-to-noise ratio to reveal the long-range order can be obtained with a single electron pulse of 700 fs in duration. A direct observation of ultrafast lattice expansion following the irradiation of femtosecond pulsed laser of Ag film has been demonstrated. (C) 2003 American Institute of Physics.