Improved reflectometer electron density profile measurements on DIII-D
Improved reflectometer electron density profile measurements on DIII-D
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DOI：
10.1063/1.1527251
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发表时间：
2003-03
影响因子：
1.6
通讯作者：
Gang Wang;L. Zeng;E. Doyle;T. Rhodes;W. Peebles
中科院分区：
文献类型：
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作者：
Gang Wang;L. Zeng;E. Doyle;T. Rhodes;W. Peebles
详细介绍了DIII-D密度剖面反射计系统的硬件和分析代码组件的最新改进。对硬件的改进提高了系统信噪比，减少了寄生反射。本文提出了一种改进的自动化方法来精确地确定零密度等离子体的起始位置。通过这些改进，零密度等离子体起始位置的不确定度从100 μ s减小到100 μ s，固定反射镜靶的位置不确定度从100 μ s减小到100 μ s。
Details are presented of recent improvements to hardware and analysis code components of the DIII-D density profile reflectometer system. The improvements to the hardware increased the system signal-to-noise ratio and reduced spurious reflections. An improved automated method is developed to accurately determine the zero density plasma start position. With these improvements the uncertainty in the zero density plasma start position is reduced from ∼7 to ∼2 mm, the position uncertainty with a fixed mirror target is reduced from ∼4 to ∼2 mm, and the time resolution is improved to 10 μs (previously ∼100 μs).