A novel analytic method for the broadband determination of electromagnetic impedances and material parameters
A novel analytic method for the broadband determination of electromagnetic impedances and material parameters
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一种宽带确定电磁阻抗和材料参数的新颖分析方法
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发表时间：
1995
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通讯作者：
R. Pelster
中科院分区：
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作者：
R. Pelster
本文描述了一种简单的分析技术，可以通过一次设置和一次扫描，确定从准静态频率（一些Hz）到2 GHz的复杂阻抗。样品被放置在插入传输线的屏蔽电容式测量单元中。在一个信号方向上测量该装置的传输系数，即只需要两个接收通道。一个完整的校准是实现只有两个标准。通过这些阻抗测量，可以确定电介质和具有频率范围限制的磁性材料参数。可以进行温度相关的校准和测量，甚至可以确定低至tan /spl delta/=5/spl middot/10/sup -4/和小阻抗Z/spl ges/0.05 /spl Omega/的低损耗。在5hz ~ 2ghz近90年的频率范围内对该方法的适用性进行了实验验证。>
A simple analytic technique is described that allows the determination of complex impedances from quasistatic frequencies (some Hz) up to 2 GHz with one setup and a single sweep. Samples are placed in a shielded capacitor-like measurement cell that is inserted into a transmission line. The transmission coefficient of the setup is measured for one signal direction, i.e., only two receiver channels are needed. A complete calibration is achieved with only two standards. Dielectric and, with restrictions in the frequency range, magnetic material parameters can be determined via these impedance measurements. Temperature-dependent calibration and measurement are possible and even low losses down to tan /spl delta/=5/spl middot/10/sup -4/ and small impedances Z/spl ges/0.05 /spl Omega/ can be determined. The applicability of the method is experimentally verified over a frequency range of nearly nine decades from 5 Hz to 2 GHz. >