Design and Realization of 3D Printed AFM Probes

Design and Realization of 3D Printed AFM Probes
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DOI:
10.1002/smll.201800162
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发表时间:
2018-05-09
期刊:
影响因子:
13.3
通讯作者:
Brown, Keith A.
Brown, Keith A.
中科院分区:
材料科学1区
文献类型:
--
作者:
Alsharif, Nourin;Burkatovsky, Anna;Brown, Keith A.

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原子力显微镜(AFM)探针和AFM成像扩展是非常精细的硅微加工的产物,但也受到这些制造技术的限制。在这里,纳米级增材制造技术直接激光写入探索作为一种方法来打印单片悬臂探针的原子力显微镜。不仅发现3D打印探针有效地用于AFM,而且它们还具有几个优点,最值得注意的是能够以间歇接触模式成像,带宽大约是类似硅探针的十倍。此外,发现3D打印提供的任意结构控制能够编程探针的模态结构,这一能力在共振放大非线性尖端-样品相互作用的背景下可能是有用的。总的来说,这些结果表明,3D打印探针补充了使用传统硅微机械加工生产的探针,并为新的成像技术打开了大门。
Atomic force microscope (AFM) probes and AFM imaging by extension are the product of exceptionally refined silicon micromachining, but are also restricted by the limitations of these fabrication techniques. Here, the nanoscale additive manufacturing technique direct laser writing is explored as a method to print monolithic cantilevered probes for AFM. Not only are 3D printed probes found to function effectively for AFM, but they also confer several advantages, most notably the ability to image in intermittent contact mode with a bandwidth approximately ten times larger than analogous silicon probes. In addition, the arbitrary structural control afforded by 3D printing is found to enable programming the modal structure of the probe, a capability that can be useful in the context of resonantly amplifying nonlinear tip-sample interactions. Collectively, these results show that 3D printed probes complement those produced using conventional silicon micromachining and open the door to new imaging techniques.