An approach to high-throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries
An approach to high-throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries
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组合多晶薄膜库的高通量 X 射线衍射分析方法
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
S. A. Ansari
中科院分区：
文献类型：
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作者：
S. Roncallo;O. Karimi;K. Rogers;D. Lane;S. A. Ansari
随着材料领域对更高发现率的需求，能够快速、可靠地调查大量样品特性的表征技术至关重要。使用薄膜的化学组合方法可以提供详细的相图，而无需生成多个单独的样品。这是通过形成高密度文库的成分梯度来实现的。随后使用化学或结构探针的常规光栅扫描来询问文库。引入了一种新的替代光栅扫描方法，以提供使用 X 射线衍射探头进行高通量数据收集和分析的方法。使用扩展的 X 射线源对文库进行询问，并使用区域探测器收集散射数据。一种简单的“分区”这种散射分布的技术可以确定与传统光栅扫描结果相当的信息，但大大减少了收集时间。该技术已使用合成 X 射线散射分布和从人造样品中获得的分布进行了测试。在所有情况下，分区算法都被证明是稳健的并且提供可靠的数据；沿库主轴的分辨力为 500 mm，晶格参数分辨率为 10 3 Å mm。讨论了该技术的局限性并描述了未来的潜在应用。
With the demand for higher rates of discovery in the materials field, characterization techniques that are capable of rapidly and reliably surveying the characteristics of large numbers of samples are essential. A chemical combinatorial approach using thin films can provide detailed phase diagrams without the need to produce multiple, individual samples. This is achieved with compositional gradients forming high-density libraries. Conventional raster scanning of chemical or structural probes is subsequently used to interrogate the libraries. A new, alternative approach to raster scanning is introduced to provide a method of high-throughput data collection and analysis using an X-ray diffraction probe. Libraries are interrogated with an extended X-ray source and the scattering data collected using an area detector. A simple technique of ‘partitioning’ this scattering distribution enables determination of information comparable to conventional raster scanned results but in a dramatically reduced collection time. The technique has been tested using synthetic X-ray scattering distributions and those obtained from contrived samples. In all cases, the partitioning algorithm is shown to be robust and to provide reliable data; discrimination along the library principal axis is shown to be 500 mm and the lattice parameter resolution to be 10 3 Å mm . The limitations of the technique are discussed and future potential applications described.