Muon capture probability of carbon and oxygen for CO, CO2, and COS under low-pressure gas conditions
Muon capture probability of carbon and oxygen for CO, CO2, and COS under low-pressure gas conditions
复制标题
低压气体条件下CO、CO2和COS对碳和氧的μ介子捕获概率
DOI:
10.1007/s10967-014-3602-3
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发表时间:
2015
影响因子:
1.6
通讯作者:
A. Shinohara
中科院分区:
文献类型:
--
作者:
G. Yoshida;K. Ninomiya;T. U. Ito;W. Higemoto;T. Nagatomo;P. Strasser;N. Kawamura;K. Shimomura; Y. Miyake;T. Miura;K. M. Kubo;A. Shinohara
When a negatively charged muon is stopped in a substance, it is captured by an atom of the substance, and the muonic atom is formed. The muon capture process is significantly affected by the chemical environment of the atom and factors such as molecular structure (chemical effect). In this study, we performed muon irradiation for low-pressure CO, CO2, and COS molecules and measured the muonic X-rays emitted immediately after muon capture by an atom. In this paper, we quantitatively discuss the muon capture probability of each type of atom using the LMM model.