A Built-In Self-Test and In Situ Analog Circuit Optimization Platform
A Built-In Self-Test and In Situ Analog Circuit Optimization Platform
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DOI：
10.1109/tcsi.2018.2805641
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发表时间：
2018-10-01
影响因子：
5.1
通讯作者：
Sanchez-Sinencio, Edgar
中科院分区：
文献类型：
--
作者：
Lee, Sanghoon;Shi, Congyin;Sanchez-Sinencio, Edgar
本文提出了一种内建自测试和现场模拟电路优化平台。通过集成全数字优化引擎和自测试电路沿着以及优化电路（CUO），该平台可以自动找到在多个竞争特性目标之间取得良好平衡的工作点。因此，即使在存在大的工艺电压温度变化和器件老化效应的情况下，也可以优化任意线性时不变CUO。对该平台进行分析，以确定其构建模块在噪声和线性方面所需的精度。利用Tow-Thomas带通双二阶滤波器的实例研究证明了该平台的可行性。
In this paper, a built-in self-test and in situ analog circuit optimization platform is proposed and characterized. By integrating a fully digital optimization engine and self-test circuits along with circuits-under-optimization (CUO), this platform can automatically find an operating point that makes a good balance among multiple competing characteristic goals. Therefore, the arbitrary linear time-invariant CUO can be optimized even when there are large process-voltage-temperature variations and aging effects of devices. This platform is analyzed to determine the required accuracy of its building blocks in terms of noise and linearity. The feasibility of this platform is proved by a case study utilizing a Tow-Thomas bandpass biquad.