THz-wave phase shift measurement by THz-wave interferometer
THz-wave phase shift measurement by THz-wave interferometer
复制标题
利用太赫兹波干涉仪测量太赫兹波相移
DOI：
10.1049/el.2017.0530
复制
发表时间：
2017
影响因子：
1.1
通讯作者：
J. Haruki and K. Kato
中科院分区：
文献类型：
--
作者：
Y. Yamanaka;G. Sakano;J. Haruki and K. Kato
设计了一种用于测量太赫兹波相移的太赫兹波干涉仪。在该测量系统中，相对相移是由两个光偏振器产生的太赫兹波之间的干涉推导出来的。用该干涉仪进行的实验结果表明，半导体相位调制器可以利用其色散特性作为太赫兹波移相器。
A terahertz (THz)‐wave interferometer was devised for measurement of the THz‐wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz‐wave phase shifter by utilising its chromatic dispersion.