Impact of temperature dependence of resistivity on thermal time constant of direct-current-driven Peltier device
Impact of temperature dependence of resistivity on thermal time constant of direct-current-driven Peltier device
复制标题
电阻率温度依赖性对直流驱动珀耳帖器件热时间常数的影响
DOI：
10.1002/pssc.201700118
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发表时间：
2017
期刊：
影响因子：
--
通讯作者：
Shigeo Yamaguchi and Toru Anzai
中科院分区：
文献类型：
--
作者：
Togo Shimozawa;Erisa Hirokawa;Fuyu Kobirumaki-Shimozawa;Kotaro Oyama;Seine A. Shintani;Takako Terui;Yasuharu Kushida;Seiichi Tsukamoto;Teruyuki Fujii;Shin'ichi Ishiwata;and Norio Fukuda;小林 尚俊;Shigeo Yamaguchi and Toru Anzai
我们研究了由N型bi2se0.37 te2.4和P型bi0.6 sb1.3 te3块体组成的夹层结构Peltier器件的电阻率温度依赖性对热时间常数的影响。我们证明了热时间常数的电流依赖性受到器件内部电阻的温度依赖性的强烈影响，并且我们还介绍了我们的Peltier器件的热时间常数与四个参数（热容量、塞贝克系数、导热系数和内部电阻的热梯度）之间的关系的电流表达式。
We studied the impact of the temperature dependence of electrical resistivity on the thermal time constant of our Peltier device with a sandwich structure, which is composed of N‐type Bi2Se0.37Te2.4and P‐type Bi0.6Sb1.3Te3bulks. We demonstrated that the current dependence of the thermal time constant is strongly affected by the temperature dependence of the internal electrical resistance of the device, and we also introduced an expression for the relationship between the thermal time constant and four parameters (heat capacity, Seebeck coefficient, thermal conductance, and thermal gradient of internal electrical resistance) for our Peltier device in terms of current.