Effects of DC transport currents on AC losses by the magnetically induced currents in Ag sheathed Bi(2223) tape
Effects of DC transport currents on AC losses by the magnetically induced currents in Ag sheathed Bi(2223) tape
复制标题
直流传输电流对 Ag 护套 Bi(2223) 带中磁感应电流引起的交流损耗的影响
DOI：
10.1109/77.620900
复制
发表时间：
1997
影响因子：
1.8
通讯作者：
R. Budhani
中科院分区：
文献类型：
--
作者：
M. Suenaga;Y. Fukumoto;H. Wiesmann;P. Haldar;R. Budhani
用磁感应电流技术测量了Ag包覆Bi（2223）在60 Hz时的交流损耗随外加交流场和直流输运电流的变化。结果与T。Ogasawara等人（Cryogenics，第19卷，1979年12月，第236 -740页）。一些定量的结果和理论之间的分歧的可能来源进行了讨论。
AC losses at 60 Hz for a Ag sheathed Bi(2223) by a magnetically induced current technique were measured as a function of applied AC field and DC transport current. The results were qualitatively in agreement with the theory, which is based on Bean critical state model, by T. Ogasawara, et al. (Cryogenics, Vol.19, Dec. 1979, pp.236-740). Possible sources for some quantitative disagreements between the results and the theory are discussed.