Determination of Coating Thickness of DEHS on Submicron Particles by Means of Low Pressure Impaction
Determination of Coating Thickness of DEHS on Submicron Particles by Means of Low Pressure Impaction
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低压冲击法测定亚微米颗粒上DEHS的包覆厚度
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
G. Kasper
中科院分区：
文献类型：
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作者：
M. Seipenbusch;A. Heel;A. Weber;G. Kasper
亚微米和纳米级颗粒在过程工程中的应用日益增加，这就要求采用新的方法来表征颗粒的性质。在目前的工作中，低压冲击作为一个非常敏感的方法，用于表征纳米粒子的涂层。涂层厚度的测定是基于由于颗粒和涂层材料的不同密度而引起的有效密度的变化。作为模型系统，使用了球形银纳米颗粒的涂层和银纳米颗粒与DEHS（癸二酸二（2-乙基己基）酯）的团聚体。串联差分建模分析仪（DMA）设置作为低压冲击器（LPI）获得的测量结果的参考。LPI对球形颗粒的涂层显示出非常高的灵敏度。可以检测到小于1 nm的颗粒半径的变化。与球形颗粒相反，附聚颗粒没有显示出涂层厚度与涂层附聚物的有效密度变化之间的明确相关性。
The increasing use of submicron and nano-scaled particles in process engineering sets a demand for new methods for the characterization of particle properties. In the present work low pressure impaction as a very sensitive method for the characterization of the coating of nanoparticles is introduced. The determination of the coating thickness is based on the change of effective density due to the differing densities of particle and coating material, As model systems the coating of spherical silver nanoparticles and agglomerates of silver nanoparticles with DEHS (di(2-ethylhexyl)sebacate) were used. A tandem differential modelling analyzer (DMA) setup served as a reference for the measurement results obtained with the low pressure impactor (LPI). The LPI showed a very high sensitivity for the coating of spherical particles. Changes of the particle radius below 1 nm could be detected. In contrast to spherical particles, agglomerated particles did not show a clear correlation between coating thickness and the change of effective density for coated agglomerates.