Characterization of Planar Defect in Layered Perovskite Photocatalyst Y$_2$Ti$_2$O$_5$S$_2$ by Electron Microscopy and First-Principles Calculations
Characterization of Planar Defect in Layered Perovskite Photocatalyst Y$_2$Ti$_2$O$_5$S$_2$ by Electron Microscopy and First-Principles Calculations
复制标题
通过电子显微镜和第一原理计算表征层状钙钛矿光催化剂 Y$_2$Ti$_2$O$_5$S$_2$ 中的平面缺陷
DOI:
10.1021/acs.jpcc.3c00820
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发表时间:
2023
影响因子:
3.7
通讯作者:
and Seiichiro L. Ten-no
中科院分区:
文献类型:
--
作者:
Mamiko Nakabayashi;Kazutaka Nishiguchi;Xizhuang Liang;Takashi Hisatomi;Tsuyoshi Takata;Takashi Tsuchimochi;Naoya Shibata;Kazunari Domen;and Seiichiro L. Ten-no
Layered perovskite Y2Ti2O5S2is a promising semiconductor photocatalyst with an electronic structure suitable for overall water splitting under visible light. However, similar to other photocatalysts, structural defects during synthesis should be controlled. Transmission electron microscopy (TEM) revealed extremely large planar defects composed of S–Mg–S layers in Y2Ti2O5S2synthesized using the flux method. We determined the planar defect structure and electronic structure using first-principles calculations based on the density functional theory. The evaluation of the formation energy suggests that S- and Mg-poor conditions may prevent defect formation. Furthermore, we discuss the impurity levels caused by the planar defects and their effects on the electronic state and catalytic performance.