A reappraisal of the validity of the IEM model for backscattering from rough surfaces
A reappraisal of the validity of the IEM model for backscattering from rough surfaces
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DOI：
10.1109/tgrs.2003.815405
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发表时间：
2004-04
期刊：
影响因子：
--
通讯作者：
Tzong-Dar Wu;Kun Shan Chen
中科院分区：
文献类型：
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作者：
Tzong-Dar Wu;Kun Shan Chen
研究了积分方程法（IEM）表面散射模型在实验室测量和数值模拟中的适用性。通过重新推导散射系数，使所有相位项保持在绿色函数的谱表示中，得到了单次散射和多次散射的新表达式。经过相当复杂的数学运算，得到了一个相当紧凑的形式的散射系数。此外，模型中使用的菲涅耳反射系数被一个过渡函数所取代，该函数考虑了表面粗糙度和介电常数。后向散射情况下的数值模拟和测量结果的比较表明，IEM的改进，变得更加准确和实用的使用。
An integral equation method (IEM) surface scattering model was examined in terms of its applicability to laboratory measurement and numerical simulations. New expressions for both single scattering and multiple scattering were obtained by rederiving the scattering coefficient to keep all the phase terms in the spectral representation of the Green's function. After quite intricate mathematical manipulations, a fairly compact form is obtained for the scattering coefficients. In addition, the Fresnel reflection coefficients used in the model were replaced by a transition function that takes surface roughness and permittivity into account. The results of comparisons with both the numerical simulations and measurements for the backscattering case indicate that the IEM is improved, becoming more accurate and practical to use.