Scanning transmission X-ray microscopy at a bending magnet beamline at the Advanced Light Source
Scanning transmission X-ray microscopy at a bending magnet beamline at the Advanced Light Source
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DOI：
10.1051/jp4:200300017
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发表时间：
2003-03-01
期刊：
影响因子：
--
通讯作者：
Warwick, T
中科院分区：
文献类型：
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作者：
Ade, H;Kilcoyne, ALD;Warwick, T
在过去的二十年中，扫描透射X射线显微镜（STXM）已经发展成为一个强大的表征工具。为了获得最佳性能，STXM位于同步加速器设施的波荡器源处。波荡器源和相关联的光束线的稀缺性和昂贵性限制了可用STXM的数量。我们已经成功地重新检查了使用的弯曲磁铁作为源的STXM和实施的干涉仪控制STXM具有优异的性能在光束线5.3.2。在先进光源在碳K边缘附近，具有30 nm半周期的周期性特征可以用具有40 nm最外区宽度的波带片分辨，其能量分辨率对应于100 meV和约1 MHz的强度。描述了该显微镜的设计和性能。
During the last two decades, scanning transmission x-ray microscopy (STXM) has evolved into a powerful characterization tool. For best performance, STXM's are located at undulator sources at synchrotron facilities. The scarcity and expense of undulator sources and associated beamlines limits the number of available STXMs. We have successfully re-examined the use of bending magnets as a source for a STXM and implemented a interferometer controlled STXM with excellent performance at the beamline 5.3.2. at the Advanced Light Source. Near the carbon K-edge, periodic features with 30 nm half-period could be resolved with a zone plate that has a 40 nm outermost zone width with an energy resolution corresponding to 100 meV and an intensity of about 1 MHz. The design and performance of the microscope are described.