Effective atomic number image determination with an energy-resolving photon-counting detector using polychromatic X-ray attenuation by correcting for the beam hardening effect and detector response
Effective atomic number image determination with an energy-resolving photon-counting detector using polychromatic X-ray attenuation by correcting for the beam hardening effect and detector response
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DOI：
10.1016/j.apradiso.2021.109617
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发表时间：
2021-02-13
影响因子：
1.6
通讯作者：
Okada, Masahiro
中科院分区：
文献类型：
--
作者：
Kimoto, Natsumi;Hayashi, Hiroaki;Okada, Masahiro
在这项研究中，我们提出了一种基于光子计数技术的有效原子序数（Z（eff））测定方法。所提出的方法可以基于多色 X 射线校正光束硬化效应和探测器响应，以实现高精度的材料识别。为了证明我们方法的有效性，该程序应用于由原型能量分辨光子计数探测器获取的 X 射线图像，我们获得了 Z(eff) 图像，无论质量厚度如何，其精度为 Z(eff) +/- 0.5。
In this study, we propose an effective atomic number (Z(eff)) determination method based on a photon-counting technique. The proposed method can correct for the beam hardening effect and detector response based on polychromatic X-rays to allow high accuracy material identification. To demonstrate the effectiveness of our method, the procedure was applied to X-ray images acquired by a prototype energy-resolving photon-counting detector and we obtained an Z(eff) image with accuracy of Z(eff) +/- 0.5 regardless of the mass thickness.