One-step synthesis of Ni0.5Zn0.5Fe2O4 fine-patterned films via photosensitive sol–gel route
One-step synthesis of Ni0.5Zn0.5Fe2O4 fine-patterned films via photosensitive sol–gel route
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DOI：
10.1016/j.ceramint.2013.03.027
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发表时间：
2013-09
影响因子：
5.2
通讯作者：
Fuxue Yan;Gaoyang Zhao;Yuanqing Chen;Nakyung Song;N. Zhao;C. You
中科院分区：
文献类型：
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作者：
Fuxue Yan;Gaoyang Zhao;Yuanqing Chen;Nakyung Song;N. Zhao;C. You
以乙酸镍、乙酸锌和硝酸铁为原料，采用光敏溶胶-凝胶法制备了Ni 1 − xZnxFe 2 O 4（NZFO）（x=0.0-0.7）薄膜。随着锌的替代，NZFO薄膜的饱和磁化强度呈抛物线趋势。当Zn取代量为0.5时，饱和磁化强度达到最大值683 emu/cm 3，室温下磁化强度较低，为56 Oe。利用X射线衍射仪（XRD）、拉曼光谱、X射线光电子能谱（XPS）、场发射扫描电子显微镜（FESEM）和透射电子显微镜（TEM）对薄膜的物相组成和表面形貌进行了表征。通过直接图案化工艺，通过螯合物与紫外光之间的光化学反应获得了精细图案化的Ni 0. 5 Zn 0. 5 Fe 2 O 4薄膜。
Ni1−xZnxFe2O4(NZFO) (x=0.0–0.7) films were prepared by a photosensitive sol–gel route utilizing nickel acetate, zinc acetate and ferric nitrate as starting materials. The saturation magnetization of the NZFO film showed a parabolic tendency with Zn substitution. For Zn substitution of 0.5, the saturation magnetization reached the maximum value of 683 emu/cm3with a relative low coercivity of 56 Oe at room temperature. The phase constituents and surface morphology of the films were characterized by X-ray diffractometer (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM). Through a direct patterning process, a fine-patterned Ni0.5Zn0.5Fe2O4film was obtained by a photochemical reaction between the chelated complexes and UV light.